International Design and Test Workshop : [proceedings , December16 - 18 2007/ Edited by Yervant Zorian with ... [et al.]
Material type:
TextPublication details: Egypt : [IEEE Signal Processing Society], 2007Description: 271 p. : ill. ; 30cmContent type: - text
- Unmediated
- volume
- IDT{u2019}07
- The Second International Design and Test Workshop
- Integrated circuits -- Fault tolerance -- Congresses
- Integrated circuits -- Very large scale integration
- Integrated circuits -- Very large scale integration -- Testing -- Congresses
- Integrated circuits -- Very large scale integration -- Design and construction
- Integrated circuits -- Very large scale integration -- Design and construction -- Congresses
- Integrated circuits -- Very large scale integration -- Testing
| Item type | Current library | Home library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|---|
Continuing Resources
|
قاعة الصحف والدوريات - الدور الثالث | المكتبة المركزبة الجديدة - جامعة القاهرة | 621.39 I61217 2007 H.M. (Browse shelf(Opens below)) | C.1 | Available | 01000110205033000 |
Includes bibliographical references and index
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