Thesis (Ph.D.) - Cairo University - Faculty of Agriculture - Department of Plant Pathology

The levels of field resistance, which are known as partial resistance to wheat leaf rust, caused by puccinia triticina were studied at adult plant stages, to show the durability and stability of Egyptian wheat cultivars during the period from 2012 to 2016. A wheat cultivar to, posses leaf rust durable resistance, must undergo some tests to prove its durability. In this study fourteen tested wheat cultivars were grown under field conditions at four locations in. Kafr Elsheikh, Behira, Sharqia and Beni Swef governorates during four successive growing seasons (2012/13-2015/16).The final rust severity (FRS%), (r- value) and (AUDPC) were found to be of lower values in wheat cultivars, Gemmiza 12, Sids 12, Sids 13, Misr 1, Misr 2, Giza 168, Giza 171 and Sakha 94, These cultivars are characterized and believed to have durable resistance to leaf rust. Under greenhouse conditions the wheat cultivars gemmiza 12, Sids 13, Giza 168, Giza 171 and Sakha 94 had longest incubation period (12 days) and latent period (13-15 days) in addition to they exhibited, the lowest values of pustules denisity cm2 ranged from (5.00 to 15 cm2) and pustule size (mm2), ranged from 0.023 to 0.088 mm2. These five cultivars could be characterized as highly resistance to leaf rust. Thirteen cultivars were identified by moluaclar marker for Lr13, Lr34 and Lr46 data showed that the wheat cultivars Giza 168 and Giza 171 carry the three genes of durable resistance Lr13, Lr34 and Lr46, followed by cultivars i.e. Gemmiza 9, gemmiza 10, gemmiza 12, Sids 12, Sids 13, Misr 1, Misr 2 and Sakha. 94 which carry two durable resistance genes Lr34 and Lr46

Issued also as CD