Study of solar selective absorbance properties for rf sputtered and oxidized thin films / Hanan Hassan Ibrahim Sayed Abouarab ; Supervised Iman S. Elmahallawi , Amal S. Kasry
Material type: TextLanguage: English Publication details: Cairo : Hanan Hassan Ibrahim Sayed Abouarab , 2020Description: 75 P. : charts , facsimiles ; 30cmOther title:- دراسة خصائص الامتصاص الشمسى للطبقات الرقيقة المرسبة بواسطة الماجنترون والمؤكسدة [Added title page title]
- Issued also as CD
Item type | Current library | Home library | Call number | Copy number | Status | Date due | Barcode | |
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Thesis | قاعة الرسائل الجامعية - الدور الاول | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.13.12.M.Sc.2020.Ha.S (Browse shelf(Opens below)) | Not for loan | 01010110080889000 | |||
CD - Rom | مخـــزن الرســائل الجـــامعية - البدروم | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.13.12.M.Sc.2020.Ha.S (Browse shelf(Opens below)) | 80889.CD | Not for loan | 01020110080889000 |
Thesis (M.Sc. ) - Cairo University - Faculty of Engineering - Department of Metallurgical Engineering
The first part of this work studiesthe optical properties of Al, Ti, and TiNi thin films deposited on both Al and stainless-steel substrates using RF PVD sputtering technique. The second part covers the effect of heat treatment (oxidation) of the as deposited thin films on SS substrates in air at 400 and 800{u00BA}C on their optical properties. In the third part, structural and microstructure of the as-deposited thin films and oxidized thin films are studied. The optical properties of all thin films before and after oxidation are characterized by spectrophotometer and Fourier transform infrared spectroscopy (FTIR). The morphology and structure are studied by scanning electron microscope (SEM), atomic force microscope (AFM), X-ray diffraction (XRD), and Energy Dispersive Analysis of X-ray(EDAX). It was found that the optical absorbance of thesputtered thin films exhibits a change after oxidation at 400{uF0B0}C and increases with a stable profile in ultraviolet (UV), visible, and near infrared (IR) ranges
Issued also as CD
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