International Design and Test Workshop :   [proceedings , December16 - 18 2007/  
 IDT07  The Second International Design and Test Workshop 
Edited by Yervant Zorian with ... [et al.] 
 - Egypt :   [IEEE Signal Processing Society],    2007 
 - 271 p. :    ill. ;   30cm 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Fault tolerance--Congresses<br/>Integrated circuits--Very large scale integration<br/>Integrated circuits--Very large scale integration --Testing--Congresses<br/>Integrated circuits--Very large scale integration--Design and construction<br/>Integrated circuits--Very large scale integration--Design and construction -- Congresses<br/>Integrated circuits--Very large scale integration--Testing