TY  - BOOK
AU  - Zorian,Yervant
ED  - International Design and Test Workshop 
ED  - IEEE Computer Society.
ED  - Institute of Electrical and Electronics Engineers
TI  - International Design and Test Workshop : : [proceedings ,
PY  - 2007///
CY  - Egypt : 
PB  - [IEEE Signal Processing Society], 
KW  - Integrated circuits
KW  - Fault tolerance
KW  - Congresses
KW  - Very large scale integration
KW  - Testing
KW  - Design and construction
KW  -  Congresses
N1  - Includes bibliographical references and index
ER  -