TY  - GEN
AU  - Ahmed ElHussein Mohamed Kamel
AU  - AbdelHakim Saad , 
AU  - Mohamed Abd El Harith , 
TI  - Study of the effect of different laser energies and weak extremely - low - frequency magnetic field on chick embryo development / 
PY  - 2006///
CY  - Cairo : 
PB  - Ahmed ElHussein Mohamed Kamel , 
KW  - Chick embryo development
KW  - Effect of different laser energies
KW  - Magnetic field
KW  - Weak extremely
N1  - Thesis (M.Sc.) - Cairo University - National Institute Of Laser Enhanced Sciences - Department Of Environmental Photochemistry , Photobiology and Agricultural; Issued also as CD
N2  - The present study is concerned with the effect of different Laser energies and weak extremely - low - frequency magnetic field on the development of chick embryosIn this study , freshly fertilized chicken eggs were exposed during the first 48 hours of post lying incubation to different Laser power densities (01 , 02 , 03 , 12 and 2 mW / cm2) and magnetic field (10 æT peak - to - peak amplitude) Following exposure , the eggs were allowed to incubate for an additional 9 days in the absence of laser energies and magnetic fieldThe embryos were taken out of the eggs and studied blindEach of the exposed groups showed variable degree in the percentage of developmental anomalies compared with the respective sham - exposed controlsHistopathological features were identified in the chick embryos using optical microscopical methodThe distribution of naturally occurring apoptosis (or programmed cell death) in chick embryos was also studied via the electron microscopical analysisMoreover , different levels of circulating cytokines (mainly IL - 2 and INF - ?) were investigated in the two exposed and sham - exposed animalsCollectively , these results reveal that exposure to both different Laser energies and electromagnetic waves can induce irreversible developmental alterationsThe data also validate previous work based on the study of Laser energies and electromagnetic waves effects at day 2 of chick embryonic development under field exposure
UR  - http://172.23.153.220/th.pdf
ER  -