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Hardness assurance and testing of ASICs exposed to SPACE radiation / Hamzah Ahmed Ali Abdelaziz ; Supervised Ihab Talkhan , Ahmed AbouAuf , Amr Wassal by
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Specialized;
Language: English
Publication details: Cairo : Hamzah Ahmed Ali Abdelaziz , 2012
Dissertation note: Thesis (M.Sc.) - Cairo University - Faculty of Engineering - Department of Computer Engineering
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  • ضمان و إختبار مناعة الدوائر الالكترونية المتعرضة لإشعاع الفضاء
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Availability: Items available for reference: قاعة الرسائل الجامعية - الدور الاول: Not for loan (1)Location, call number: Cai01.13.06.M.Sc.2012.Ha.H. مخـــزن الرســائل الجـــامعية - البدروم: Not for loan (1)Location, call number: Cai01.13.06.M.Sc.2012.Ha.H.

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2.
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Identifying worst - case test vectors for leakage current and delay failures induced by total dose in CMOS ASIC / Mostafa Mahmoud Abdelaziz Mohamed ; Supervised Ihab Elsyaed Talkhan , Amr Galal Eldin Ahmed Wassal by
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Specialized;
Language: English
Publication details: Cairo : Mostafa Mahmoud Abdelaziz Mohamed , 2014
Dissertation note: Thesis (M.Sc.) - Cairo University - Faculty of Engineering - Department of Computer Engineering
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  • عند تعرضها للآشعاع CMOS تحديد حالات الاختبارات التى تؤدى الى اسوأ تسريب فى التيار الكهربائى و اخطاء التاخير للدوائر المتكاملة التى تستخدم تكنولوجيا ال
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Availability: Items available for reference: قاعة الرسائل الجامعية - الدور الاول: Not for loan (1)Location, call number: Cai01.13.06.M.Sc.2014.Mo.I. مخـــزن الرســائل الجـــامعية - البدروم: Not for loan (1)Location, call number: Cai01.13.06.M.Sc.2014.Mo.I.

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