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Design for testing using boundary scan / Hossam Yosry Abdelfattah ; Supervised Amin M. Nassar , Magdy F. Ragaee , Ahmed H. Khalil

By: Contributor(s): Material type: TextTextLanguage: English Publication details: Cairo : Hossam Yosry Abdelfattah Ibrahim , 2014Description: 97 P. , (2) folded pages of platas : plans , photographs ; 30cmOther title:
  • تصميم دوائر الاختبار باستخدام تقنية المسح الحدودى [Added title page title]
Subject(s): Available additional physical forms:
  • Issued also as CD
Dissertation note: Thesis (M.Sc.) - Cairo University - Faculty of Engineering - Department of Electronics and Communications Summary: The boundary scan method was developed and adopted as the IEEE standard 1149.1. The objective of this powerful standard is to overcome many of the drawbacks of the other traditional test techniques, such as functional test-ing and in- circuit testing (ICT), and improves the product quality. This thesis explores the application of Boundary Scan Compatible digital VLSI devices. So, IEEE - 1149.1 boundary scan architecture is presented. This thesis explores the application of boundary scan compatible digital VLSI devices. A testing archi - tecture of the boundary scan, designed for channel card of mltiplexer project is selected as the circuit under test
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Item type Current library Home library Call number Copy number Status Date due Barcode
Thesis Thesis قاعة الرسائل الجامعية - الدور الاول المكتبة المركزبة الجديدة - جامعة القاهرة Cai01.13.08.M.Sc.2014.Ho.D (Browse shelf(Opens below)) Not for loan 01010110064488000
CD - Rom CD - Rom مخـــزن الرســائل الجـــامعية - البدروم المكتبة المركزبة الجديدة - جامعة القاهرة Cai01.13.08.M.Sc.2014.Ho.D (Browse shelf(Opens below)) 64488.CD Not for loan 01020110064488000

Thesis (M.Sc.) - Cairo University - Faculty of Engineering - Department of Electronics and Communications

The boundary scan method was developed and adopted as the IEEE standard 1149.1. The objective of this powerful standard is to overcome many of the drawbacks of the other traditional test techniques, such as functional test-ing and in- circuit testing (ICT), and improves the product quality. This thesis explores the application of Boundary Scan Compatible digital VLSI devices. So, IEEE - 1149.1 boundary scan architecture is presented. This thesis explores the application of boundary scan compatible digital VLSI devices. A testing archi - tecture of the boundary scan, designed for channel card of mltiplexer project is selected as the circuit under test

Issued also as CD

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