Broadband material characterization using whispering-gallery-mode dielectric resonators / Mohamed Salah Kheir ; Supervised Hany Hammad , Abbas Omar
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TextLanguage: English Publication details: Cairo : Mohamed Salah Kheir , 2011Description: 128 Leaves : charts ; 30cmDissertation note: Thesis (Ph.D.) - German University - Faculty of Postgraduate Studies and Scientific Research - Department of Information Engineering and Technology Summary: Measurement and characterization of dielectric material properties are always demandable for many applications. Some of these applications are, for instance, medical imaging, detection of tumors in biological substances and several agricultural and industrial applications. Material characterization techniques are classified, in general, into resonant and non-resonant
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Thesis
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قاعة الثقاقات الاجنبية - الدور الثالث | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.34.Ph.D.2011.Mo.B (Browse shelf(Opens below)) | Not for loan | 01010110060262000 |
Thesis (Ph.D.) - German University - Faculty of Postgraduate Studies and Scientific Research - Department of Information Engineering and Technology
Measurement and characterization of dielectric material properties are always demandable for many applications. Some of these applications are, for instance, medical imaging, detection of tumors in biological substances and several agricultural and industrial applications. Material characterization techniques are classified, in general, into resonant and non-resonant
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