Preparation and characterization of superconducting YBCO nano-layer pulsed laser deposition / Deyaa Eldin Hassan Fikry Elsabbahy ; Supervised Yehia Abdelhamid Badr , Tharwat Elsherbini , Mortada Youssef
Material type: TextLanguage: English Publication details: Cairo : Deyaa Eldin Hassan Fikry Elsabbahy , 2016Description: 116 P. : photographs ; 25cmOther title:- تحضير و توصيف نانونية من أكسيد يتريم باريوم النحاس فائقة التوصيل باستخدام الترسيب بالليزر النبضى [Added title page title]
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Item type | Current library | Home library | Call number | Copy number | Status | Date due | Barcode | |
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Thesis | قاعة الرسائل الجامعية - الدور الاول | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.24.12.M.Sc.2016.De.P (Browse shelf(Opens below)) | Not for loan | 01010110072758000 | |||
CD - Rom | مخـــزن الرســائل الجـــامعية - البدروم | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.24.12.M.Sc.2016.De.P (Browse shelf(Opens below)) | 72758.CD | Not for loan | 01020110072758000 |
Thesis (M.Sc.) - Cairo University - National Institute of Laser Enhanced Sciences - Department of Laser Sciences and Interaction
This study, entitled: Preparation and characterization of superconducting nano-layers by pulsed laser deposition". The aim of this study was to prepare the nano-layers of YBCO superconductor material by using pulsed laser deposition technique, Samples of Bulk YBCO material had been prepared by dry chemical reaction, the chemical composition of the resulted YBa₂Cu₃O₆.₇₈ andYBa₂Cu₃O₆.₉₆₂ respectively. Then the nano-layer samples were prepared in the presence and absence of oxygen by pulsed laser deposition (PLD) technique on a quartz substrate of quartz. The chemical composition of the resulted nano layers were Y₂Ba₄Cu₈O₂₀₋x and Y₂Ba₅Cu₇Ox respectively. characterization of the nano-layer samples and bulk samples was conducted through a series of tests where the samples are exposed to a several tests and measurements such as misner effect, X-ray diffraction and energy dispersion X-ray and measurement of the critical temperature TC as well as measuring the raman spectra. The nano-layere samples had been exposed to several investigations and measurements such as thickness measurement through the use of a Michelson interference diffraction and atomic force microscope, SEM- scanning electronic microscope in addition to the measurement of X-ray diffraction and energy dispersion X-ray analysis. Then a comparison had been conducted between the situation of nano-layer and Bulk samples
Issued also as CD
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