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Resolution enhancements techniques for the 45nm node and beyond / Ahmed Elsayed Salem Farag Omran ; Supervised Ahmed Hussien Khalil , Hossam A. H. Fahmy , Jochen Schacht by
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Specialized;
Language: English
Publication details: Cairo : Ahmed Elsayed Salem Farag Omran , 2012
Dissertation note: Thesis (M.Sc.) - Cairo University - Faculty of Engineering - Department of Electronics and Communication
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  • أساليب تحسين الدقة في تقنية ٤٥ نانومتر و مابعدها
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Availability: Items available for reference: قاعة الرسائل الجامعية - الدور الاول: Not for loan (1)Location, call number: Cai01.13.08.M.Sc.2012.Ah.R. مخـــزن الرســائل الجـــامعية - البدروم: Not for loan (1)Location, call number: Cai01.13.08.M.Sc.2012.Ah.R.

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2.
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Sample plan creation and full chip coverage for optical proximity correction models / Mohammad Kamel Abdelfattah Kamel Moawad ; Supervised Ahmed Hussein Khalil , Hossam Aly Hassan Fahmy by
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Specialized;
Language: English
Publication details: Cairo : Mohammad Kamel Abdelfattah Kamel Moawad , 2015
Dissertation note: Thesis (M.Sc.) - Cairo University - Faculty of Engineering - Department of Electronics and Communications
Other title:
  • خطة إنشاء العينات والتغطية لكل معاملات صورة الدائرة بهدف النمذجة لتصحيح القرب الضوئي
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Availability: Items available for reference: قاعة الرسائل الجامعية - الدور الاول: Not for loan (1)Location, call number: Cai01.13.08.M.Sc.2015.Mo.S. مخـــزن الرســائل الجـــامعية - البدروم: Not for loan (1)Location, call number: Cai01.13.08.M.Sc.2015.Mo.S.

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