Spectroscopic study of Eu-doped nano semiconductors prepared by laser ablation or RF sputtering / Samah Mohamed Hamdy Ahmed ; Supervised Mostafa Elsayed , Lotfia Elnadi , Yahia Badr
نوع المادة :
نصاللغة: الإنجليزية تفاصيل النشر: Cairo : Samah Mohamed Hamdy Ahmed , 2013الوصف: 170 P. : charts , facsimiles ; 25cmعنوان آخر: - دراسة طيفية لاشتباه الموصلات النانومترية والمشابة باليورابيوم والمحضرة بطريقة الليزر الاقتلاعى أو التطاير بواسطة موجات الراديو [عنوان مضاف عنوان الصفحة]
- Issued also as CD
| نوع المادة | المكتبة الحالية | المكتبة الرئيسية | رقم الاستدعاء | رقم النسخة | حالة | الباركود | |
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Thesis
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قاعة الرسائل الجامعية - الدور الاول | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.24.12.Ph.D.2013.Sa.S (استعراض الرف(يفتح أدناه)) | لا تعار | 01010110063855000 | ||
CD - Rom
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مخـــزن الرســائل الجـــامعية - البدروم | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.24.12.Ph.D.2013.Sa.S (استعراض الرف(يفتح أدناه)) | 63855.CD | لا تعار | 01020110063855000 |
Thesis (Ph.D.) - Cairo University - National Institute of Laser Enhanced Sciences - Department of Laser Science and Interaction
Rare-earth-doped wide-bandgap semiconductors are an interesting class of inorganic luminescent materials with complex optical properties and widespread potential applications in optoelectronics. Undoped and Eu-doped GaN powders have been synthesized by the co-precipitation method followed by nitridation at high temperature. The X-ray diffraction (XRD) patterns reveal the single-phase wurtzite structure of the synthesized undoped and Eu-doped GaN powders. The morphology of the samples was examined by the field emission scanning electron microscope (FE-SEM) and the high resolution transmission electron microscope (HR-TEM), and it was shown that the micron-sized particles are composed of agglomerated nano-crystallites. This agglomeration may be due to the absence of any surfactant during the preparation. Under above bandgap excitation, the room-temperature photoluminescence (PL) of both samples show the characteristic GaN band-edge emission peak at 363 nm, as well as a broad defect-related emission band centered at around 415 nm. The Eu-doped GaN sample, under below bandgap excitation at 464 nm, exhibited red emission peaks at 593 nm and 616 nm, corresponding to the ⁵D₀ {u2192} ⁷F₁ and ⁵D₀ {u2192} ⁷F₂ transitions, respectively, within the 4f-shell of Eu³⁺ ions ions
Issued also as CD
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