Accelerated life testing using the family of the generalized logistic distribution / Salma Omar Bleed Ali ; Supervised Ahmed F. Attia , Hanan M. Aly
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TextLanguage: English Publication details: Cairo : Salma Omar Bleed Ali , 2013Description: 138 Leaves ; 30cmOther title: - اختبارات الحياة المعجلة باستخدام عائلة التوزيع اللوجيستى المعمم [Added title page title]
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قاعة الرسائل الجامعية - الدور الاول | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.18.03.Ph.D.2013.Sa.A (Browse shelf(Opens below)) | Not for loan | 01010110061761000 | ||
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مخـــزن الرســائل الجـــامعية - البدروم | المكتبة المركزبة الجديدة - جامعة القاهرة | Cai01.18.03.Ph.D.2013.Sa.A (Browse shelf(Opens below)) | 61761.CD | Not for loan | 01020110061761000 |
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| Cai01.18.03.Ph.D.2013.Ra.E Estimation in the case of Beta-weibull distribution / | Cai01.18.03.Ph.D.2013.Ra.E Estimation in the case of Beta-weibull distribution / | Cai01.18.03.Ph.D.2013.Sa.A Accelerated life testing using the family of the generalized logistic distribution / | Cai01.18.03.Ph.D.2013.Sa.A Accelerated life testing using the family of the generalized logistic distribution / | Cai01.18.03.Ph.D.2013.Ya.A About the weighted non central chi-square distribution / | Cai01.18.03.Ph.D.2013.Ya.A About the weighted non central chi-square distribution / | Cai01.18.03.Ph.D.2014.Am.O On the generalized feller-pareto distribution / |
Thesis (Ph.D.) - Cairo University - Institute of Statistical Studies and Research - Department of Mathematical Statistics
Many high-performance units made today can have extremely large reliabilities when they are operating as intended. For example, through advances in engineering science, a measurement such as time to failure for an electronic device could be quite large. For these situations, calculating the reliability is still of interest to the manufacture and to the consumer, but a long period of time may be necessary to obtain sufficient data to estimate reliability
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