Thesis (Ph.D.) - Cairo University - Institute of Statistical Studies and Research - Department of Mathematical Statistics

Estimating the time to failure distribution of products of high reliability such as electronics, power cables, metal fatigue, insulating materials, Laser, etc., is very difficult. This type of products is not likely to fail under normal use conditions in the relatively short time available for test. This makes it very difficult to assess reliability. Life test, can however, be estimated much more quickly using accelerated life testing (ALT).For most applications, it is necessary to accelerate the causes of failure by increasing a stress above its usual value. Assuming a physically reasonable statistical model relating lifetime to a certain level of stress, the life data from ALT can be used to estimate failure time under normal stress levels using such a model to extrapolate the reliability performance to the normal use conditions, give a good reliability estimate

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