000 01466cam a2200313 a 4500
003 EG-GiCUC
005 20250223031748.0
008 170730s2015 ua dh f m 000 0 eng d
040 _aEG-GiCUC
_beng
_cEG-GiCUC
041 0 _aeng
049 _aGift
097 _aM.Sc
099 _aCai01.34.M.Sc.2015.Ah.D
100 0 _aAhmed Nabil Abdelrahman Elsayed
245 1 0 _aDynamic thermal investigation of ultra- thin silicon chips /
_cAhmed Nabil Abdelrahman Elsayed ; Supervised Joachim N. Burghartz , Ahmed H. Madian
260 _aCairo :
_bAhmed Nabil Abdelrahman Elsayed ,
_c2015
300 _a85 Leaves :
_bchart , facsimiles ;
_c30cm
502 _aThesis (M.Sc. .) - German University - Faculty of Postgraduate Studies and Scientific Research - Department of Elctronics
520 _aIn recent years, the industry has witnessed a growing trend and demand for flexible elctronics and 3D integrated circuits. This trend posed a need for the overall volume reduction of silicon chips. Current traditional silicon bulk chip have thicknesses ranging 200 - 500 um, while maintaining poor mechanical characteristics
653 4 _aDynamic thermal investigation
653 4 _aSilicon chips
653 4 _aUltra- thin silicon chips
700 0 _aAhmed H. Madian ,
_esupervisor
700 0 _aJoachim N.Burghartz ,
_esupervisor
856 _uhttp://172.23.153.220/th.pdf
905 _aNazla
_eRevisor
905 _aShimaa
_eCataloger
942 _2ddc
_cTH
999 _c61709
_d61709