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Compact model for double gate tunnel field - effect transistor /

Mohamed Youssef Hassan Sayed

Compact model for double gate tunnel field - effect transistor / نموذج مدمج لترانزيستور التأثير المجالى النفقى ثنائى البوابات Mohamed Youssef Hassan Sayed ; Supervised Nadia Hussein Rafat , Serag Eldin Elsayed Habib - Cairo : Mohamed Youssef Hassan Sayed , 2015 - 83 P. : charts , facsimiles ; 30cm

Thesis (M.Sc.) - Cairo University - Faculty of Engineering - Department of Mathematics and Physics

This thesis presents a new compact model for Double-Gate Tunnel Field-Eect Transistor (DG TFET). This physically based model accounts for the tunneling at the source channel interface as well as for the drift-diusion in the channel region. It also accounts for the ON and the subthreshold modes of operation. This model enables the calculation of the I-V, Q-V and C-V characteristics of the device. The model is validated by comparing its results with that calculated numerically by the Sentaurus device simulator



DG TFET Double Gate TFET