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Study of laser induced plasma spectroscopy of metallic layers on semiconductor substrate / (Record no. 35990)

MARC details
000 -LEADER
fixed length control field 01725cam a2200337 a 4500
003 - CONTROL NUMBER IDENTIFIER
control field EG-GiCUC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250223030510.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 111025s2011 ua d f m 000 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency EG-GiCUC
Language of cataloging eng
Transcribing agency EG-GiCUC
041 0# - LANGUAGE CODE
Language code of text/sound track or separate title eng
049 ## - LOCAL HOLDINGS (OCLC)
Holding library Deposite
097 ## - Thesis Degree
Thesis Level Ph.D
099 ## - LOCAL FREE-TEXT CALL NUMBER (OCLC)
Classification number Cai01.24.05.Ph.D.2011.Ah.S
100 0# - MAIN ENTRY--PERSONAL NAME
Personal name Ahmed Hassen Ahmed Galmed
245 10 - TITLE STATEMENT
Title Study of laser induced plasma spectroscopy of metallic layers on semiconductor substrate /
Statement of responsibility, etc. Ahmed Hassen Ahmed Galmed ; Supervised Mohamed Abdelharith Mohamed , Arafa Kamal Kassem
246 15 - VARYING FORM OF TITLE
Title proper/short title دراسة أستطياف البلازما المستحثة باليزر لطبقات معدنية على ارضية شبه موصلة
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Cairo :
Name of publisher, distributor, etc. Ahmed Hassen Ahmed Galmed ,
Date of publication, distribution, etc. 2011
300 ## - PHYSICAL DESCRIPTION
Extent 150 P. :
Other physical details charts ;
Dimensions 25cm
502 ## - DISSERTATION NOTE
Dissertation note Thesis (Ph.D.) - Cairo University - National Institute of Laser Enhanced Science - Department of Laser Application in Environmental Metroology Photochemistry and Agricultural
520 ## - SUMMARY, ETC.
Summary, etc. Thin film samples of Ti (213nm) deposited onto Si (100) substrate are studied using laser induced plasma spectroscopy (LIPS). Depth profiling was carried out on samples as deposited and after thermal annealing (10⁻⁵ mbar, 450 {u00B0}C) for 1,3 and 6 hours to investigate the metal semiconductor interface dynamics before and after annealing
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE
Additional physical form available note Issued also as CD
653 #4 - INDEX TERM--UNCONTROLLED
Uncontrolled term Depth profiling
653 #4 - INDEX TERM--UNCONTROLLED
Uncontrolled term Laser induced plasma
653 #4 - INDEX TERM--UNCONTROLLED
Uncontrolled term Thin films
700 0# - ADDED ENTRY--PERSONAL NAME
Personal name Arafa Kamal Kassem ,
Relator term
700 0# - ADDED ENTRY--PERSONAL NAME
Personal name Mohamed Abdelharith Mohamed ,
Relator term
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://172.23.153.220/th.pdf">http://172.23.153.220/th.pdf</a>
905 ## - LOCAL DATA ELEMENT E, LDE (RLIN)
Cataloger Nazla
Reviser Revisor
905 ## - LOCAL DATA ELEMENT E, LDE (RLIN)
Cataloger Samia
Reviser Cataloger
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Thesis
Holdings
Source of classification or shelving scheme Not for loan Home library Current library Date acquired Full call number Barcode Date last seen Koha item type Copy number
Dewey Decimal Classification   المكتبة المركزبة الجديدة - جامعة القاهرة قاعة الرسائل الجامعية - الدور الاول 11.02.2024 Cai01.24.05.Ph.D.2011.Ah.S 01010110056097000 22.09.2023 Thesis  
Dewey Decimal Classification   المكتبة المركزبة الجديدة - جامعة القاهرة مخـــزن الرســائل الجـــامعية - البدروم 11.02.2024 Cai01.24.05.Ph.D.2011.Ah.S 01020110056097000 22.09.2023 CD - Rom 56097.CD